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Test Probe B of IEC 61032 – Jointed Test Finger

Product No: SMT-PB

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  • Description
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  • The IEC 61032 Test Probe B (Jointed Test Finger) is a precision safety tool designed to simulate human finger movement for testing access to hazardous live parts in electrical/electronic equipment—from household appliances to industrial control panels. Its dual-jointed design bends 90° (±10°) in the same plane and direction, mimicking natural finger flexibility to navigate gaps rigid probes can’t reach. A 50mm diameter baffle plate prevents over-insertion, while the 12mm knurled metal tip detects live components. Crafted from conductive stainless steel (for durability/conductivity) and paired with an insulated handle, it applies gentle 10N thrust—critical for validating safety and meeting global accessibility standards.

    Standards:

    Standards No. Clause/Figure Standards Name
    IEC 61032:2017 Clause 5.3, Figure 2 Test probes for protection against access to hazardous parts
    UL 60335-1:2023 Clause 22.5, Figure 22.5 Standard for Safety for Household and Similar Electrical Appliances – Part 1: General Requirements
    IEC 60529:2013 Clause 8.3, Figure 8.3 Degrees of protection provided by enclosures (IP Code) – Accessibility testing
    UL 60950-1:2023 Clause 6.2.1, Figure 6.2.1 Standard for Safety for Information Technology Equipment – Safety – Part 1: General Requirements

    Specifications:
    Tool Type: IEC 61032 Test Probe B (Jointed Test Finger; for hazardous live part accessibility testing)
    Probe Material: Conductive stainless steel (resistance ≤ 0.1Ω; corrosion-resistant; knurled tip for consistent contact)
    Handle Material: Insulated ABS plastic (resistance ≥ 100MΩ; heat-resistant up to 120°C; ergonomic grip for precision)
    Joint Characteristics: 2 pivot joints; max bending angle: 90° ± 10° (same plane/direction); no deformation under 10N thrust
    Key Dimensions:
    – Knurled Finger Diameter: 12mm ± 0.1mm
    – Knurled Finger Length: 80mm ± 0.2mm
    – Baffle Plate Diameter: 50mm ± 0.2mm
    – Baffle Plate Thickness: 20mm ± 0.1mm
    – Baffle Plate Length: 100mm ± 0.2mm
    – Total Length (Probe + Handle): 300mm ± 0.5mm
    Applied Thrust: 10N ± 0.5N (simulates light human finger contact; standard for accessibility testing)
    Core Function: Mimics finger movement to test access to hazardous live parts; prevents over-insertion via baffle; ensures IEC 61032 compliance

    Test Procedures:
    1. Inspect the probe for loose joints, bent tips, or cracked insulation; confirm conductivity with a test tool.
    2. Power on the equipment under test (EUT) and set it to normal operating mode.
    3. Hold the insulated handle, use the joints to guide the 12mm tip into EUT gaps (vents, panel seams, control slots).
    4. Apply steady 10N thrust—stop if the 50mm baffle touches the EUT or resistance blocks insertion.
    5. Check the connected live-part detector for signals (indicating contact with hazardous parts).
    5. Record results: Pass if no contact; Fail if the probe reaches dangerous components.

    Applications:
    1. Testing access to live wiring in household refrigerators (per IEC 61032:2017 Figure 2) to prevent electric shock.
    2. Verifying control panel gaps in office printers (compliant with UL 60950-1:2023) to block finger contact with circuits.
    3. Safety checks for industrial control box seams (per IEC 60529:2013) to avoid exposure to high-voltage terminals.
    4. Quality control for electric washing machines during manufacturing, ensuring UL 60335-1:2023 compliance.
    5. Post-production testing of small medical devices (e.g., blood pressure monitors) to validate hazardous part accessibility.

    Test Probe B of IEC 61032 – Jointed Test Finger

    Test Probe B of IEC 61032 – Jointed Test Finger

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