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IEC 61032 ArticUL ating Finger Probe with Dynamometer 10N
13 Feb, 2024 143

IEC 61032 ArticUL ating Finger Probe with Dynamometer 10N

1 General 1.1 Scope and object This International Standard(IEC61032) specifies details and dimensions of test probes intended to verify the protection provided by enclosures with regard to: – protection of persons against access to hazardous parts inside the enclosure; – protection of the equipment inside the enclosure against ingress of solid foreign objects. SMT IP20T_AL The object o...

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IEC 61032 Test Sphere Φ50 mm with Dynamometer 50N
07 Feb, 2024 163

IEC 61032 Test Sphere Φ50 mm with Dynamometer 50N

1 General 1.1 Scope and object This International Standard(IEC61032) specifies details and dimensions of test probes intended to verify the protection provided by enclosures with regard to: – protection of persons against access to hazardous parts inside the enclosure; – protection of the equipment inside the enclosure against ingress of solid foreign objects. SMT IP10T_AL The object o...

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30N Force 12.5mm Test Sphere Probe IEC 61032
23 Jan, 2024 192

30N Force 12.5mm Test Sphere Probe IEC 61032

(1)The IEC (International Electrotechnical Commission) is a worldwide organization for standardization comprising all national electrotechnical committees(IEC National Committees). The object of the IEC is to promote international co-operation on all questions concerning standardization in the electrical and electronic fields. To this end and in addition to other activities, the IEC publishes Inte...

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IP4X Test Probe with 1N Force IEC 61032
15 Dec, 2023 201

IP4X Test Probe with 1N Force IEC 61032

1 General 1.1 Scope and object This International Standard(IEC61032) specifies details and dimensions of test probes intended to verify the protection provided by enclosures with regard to: – protection of persons against access to hazardous parts inside the enclosure; – protection of the equipment inside the enclosure against ingress of solid foreign objects. SMT DT1_AL The object of ...

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