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Jointed and Unjointed Test Finger with Standard IEC 61032

Product No: SMT-TB11

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  • Description
  • The Jointed Test Finger & Unjointed Test Finger is a precision test probe made according to Figure 2 (Test Probe B) and Figure 7 (Test Probe 11) of the IEC61032 is used to simulate a human finger, used by the standards of IEC, CSA, IRAM, UL etc.

    1) IEC Jointed Test Finger 2 ( Test Probe B of IEC61032)
    Test Probe Diameter: 12 mm
    Test Probe Length: 80 mm
    Baffle Plate Thickness: 20 mm
    Baffle Plate Diameter: 50 mm
    Baffle Plate Length: 100 mm

    2) IEC Unjointed Test Finger 7 ( Test Probe 11 of IEC61032)
    Test Probe Diameter: 12 mm
    Test Probe Length: 80 mm
    Baffle Plate Thickness: 5 mm
    Baffle Plate Diameter: 50 mm

    Test Probe B of IEC61032

    Test Probe 11 of IEC61032

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