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IEC 61032 Articulating Finger Probe with Dynamometer 10N

Product No: SMT-IP20T

  • Specifications
  • Applications
  • Standards
  • Tech Articles
  • The Articulated Test Finger is a precision test probe manufactured according to Figure 2 (Test Probe B) of  IEC 61032:1997. It is in accordance with IEC 61032:1997,  IEC 60529 (IP2X), IEC 60335, UL and other standards, widely used in electrical safety testing to simulate human finger access and verify the protection of enclosures against hazardous live parts or mechanical parts. This test tool plays a critical role in ensuring product safety compliance and preventing electric shock hazards, making it an essential instrument for safety certification of household appliances, power tools, information technology equipment, and other electrical products.

    Specifications:

    • Knurled Finger Diameter: 12 mm
    • Knurled Finger Length: 80 mm (three sections total)
    • Baffle Plate Diameter: 50 mm
    • Baffle Plate Length: 100 mm
    • Baffle Plate Thickness: 20 mm

    Standards:

    • GB/T 16842-2016 Protection of persons and equipment by enclosures – Probes for verification (IDT IEC 61032:1997)
    • IEC 61032:1997 Figure 2 – Test Probe B
    • IEC 60529 (IP2X), IEC 60335-1, IEC 60950 / IEC 62368-1, UL and equivalent standards

    Features:

    • High-precision machining for accurate dimensions and smooth joint movement
    • Durable stainless steel finger with excellent corrosion resistance
    • Equipped with 10N dynamometer for precise force application
    • Non-slip handle for comfortable and safe operation
    • Fully compliant with international safety standards

    Applications:

    • IP2X protection degree testing for electrical enclosures
    • Safety testing of household appliances and power tools
    • Verification of accessibility to hazardous parts in IT and audio/video equipment
    • Compliance testing and production line quality control

      IEC 61032:1997 Figure 2

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