Product No: LEDLM-84PL
The LEDLM series of LED Optical Aging Test Instrument comprises two models: the LEDLM-80PL and the LEDLM-84PL. The LEDLM-80PL is designed for the R&D and quality inspection of single LEDs or Chips; it is equipped with a DC12010 DC power supply and a GDJW/GW series high-and-low-temperature test chamber. The LEDLM-84PL is intended for the R&D, verification, and incoming quality inspection of complete LED luminaires; it features an LSP-1KVAR AC power supply and a GDJW/GW series high-and-low-temperature test chamber.
The LEDLM series LED Optical Aging Test Instrument supports various lumen maintenance criteria, such as L70 and L50. It enables the simultaneous collection of data on the degradation of optical, chromatic, and electrical performance throughout the aging process of samples. Users can opt for a full 6,000-hour long-term aging test or utilize the Arrhenius acceleration model to project the long-term lifespan of LED products. The system automatically records the changes in luminous flux, color parameters, and electrical parameters over time, and generates standardized lumen maintenance life prediction reports with a single click. It meets the certification testing requirements for lighting products—such as those for ENERGY STAR—and is suitable for use by lighting manufacturers, third-party testing laboratories, and research institutions to conduct reliability assessments of LED light sources and luminaires.
Standards:
| Standards No. | Standards Name |
| IES LM-80-21 | Measuring Lumen Maintenance of LED Light Sources |
| IES TM-21-19 | Projecting Long-Term Lumen Maintenance of LED Light Sources |
| IES LM-84-20 | Measuring Lumen Maintenance of LED Luminaires |
| IES TM-28-21 | Projecting Long-Term Lumen Maintenance of LED Luminaires |
Specifications:
| LISUN Model | LEDLM‑80PL | LEDLM‑84PL |
| Test Sample | LEDLM‑80PL Test Report | LEDLM‑84PL Test Report |
| Standards | IES LM-80-21 and IES TM-21-19 | IES LM-84-20 and IES TM-28-21 |
| Type of test sample | R&D and Quality Testing for single LEDs or Chips | R&D and Quality Testing for LED Luminaires |
| Lifetime Prediction Model | Arrhenius model + TM-21-19 | Arrhenius model + TM-28-21 |
| Test fixtures (standard) | Includes two sets: customized for the test object (additional fixtures can be customized). | Includes two sets: capable of testing LED bulbs and tube lights (additional fixtures can be customized). |
| Number of samples that can be measured at one time | Max. is 16 pieces (customizable based on the total numbers of EUT in a single test) | |
| Lumen Maintenance Criterion Point | L70 (70%), L50 (50%), customer-defined metrics supported. | |
| Test Solution | 6,000-hour full test, or Arrhenius rapid acceleration simulation | |
| Measurement parameters | Curves showing the variation of luminous flux, chromaticity, and electrical parameters over time | |
| Mandatory configurations: | ||
| Power Supply | DC12010 Digital CC & CV DC Power Supply (Select based on the total power of EUT in a single test) | LSP-1KVAR Pure Sine Wave AC Power Source (Select based on the total power of EUT in a single test) |
| Temperature measurement and control channel | TMP-8 Eight Channel Temperature Tester (Select based on the total numbers of EUT in a single test) | |
| Supporting Test Chamber | GDJW series high/low-temperature test chambers or GW series high-temperature test chambers (Select based on the total dimensions of EUT in a single test) | |

Test Report for LED Luminous Flux Maintenance and Aging Lifespan Testing System

LED Luminous Flux Maintenance and Aging Lifespan Testing System
LISUN LEDLM-84PL/LEDLM-80PL LED Optical Aging Test Instrument – After-sales Frequently Asked Questions (FAQ)
LISUN LEDLM-84PL/LEDLM-80PL LED Optical Aging Test Instrument were in the market for more than 10 years, LISUN engineers service team already summary the most of the After Sales Questions and Answers in the above link. Please read it carefuly, you can solve the most of the problems by yourself if you have some questions while using the instruments. LISUN will be continue to update this pages and more FAQ can be found in this topic link.
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