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Home Products MIL‑STD‑461 CS116 High‑Frequency Damped Transient Pulse Generator
MIL‑STD‑461 CS116 High‑Frequency Damped Transient Pulse Generator
MIL‑STD‑461 CS116 High‑Frequency Damped Transient Pulse Generator

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MIL‑STD‑461 CS116 High‑Frequency Damped Transient Pulse Generator

Product No: LIS-CS116

  • Specifications

  • The LIS-CS116 High‑Frequency Damped Transient Pulse Generator is specifically designed for military EMC conducted susceptibility testing. It fully complies with the CS116 requirements of standards GJB 151A/B/C and MIL-STD-461E/F/G. It is primarily used to conduct susceptibility tests on interconnect and power cables for aircraft, surface ships, submarines, aerospace systems, and ground-based systems.

    Equipped with a built-in resonant oscillation excitation unit, the LIS-CS116 generates damped sinusoidal/cosinusoidal waveforms across multiple frequency bands in accordance with standard parameters. It utilizes precision impedance-matching circuitry to optimize signal transmission and control waveform damping factors, ensuring stable and controllable output. By precisely injecting high-frequency transient oscillatory pulses into the cables under test, the generator accurately reproduces the high-frequency transient electromagnetic interference environments encountered by military equipment, fully meeting the requirements for testing the conducted immunity performance of military cables and associated equipment.

    Specifications:

    LIS‑CS116 High‑Frequency Damped Transient Pulse Generator
    Oscillation Frequency (±10%) 10 kHz 、100kHz 、1 MHz 、10 MHz、 30 MHz 、100 MHz
    Maximum Output Current 10 kHz≥0.1A 、100kHz ≥1A、1 MHz≥10A 、10 MHz≥10A、 30 MHz≥10A 、100 MHz≥3A
    Output Impedance 50Ω
    Damping Factor (Q) 15±5
    Attachments Included Attenuators: Frequency range DC~3 GHz, N-type connector. High-voltage load: 50 Ω.
    Repetition Frequency 0.1~30Hz
    Decoupling Capacitor 10uF 1600VDC / 440VAC  3-phase
    Output Interface N Type
    Control System 10.1-inch Android capacitive touchscreen (Chinese/English) + remote control via PC software
    Operating Environment Temperature：10℃~40℃，Humidity：30%~70%
    Power Supply AC：100~250V@50Hz/60Hz
    Overall Dimensions 4U/19″ Standard chamber
    Mandatory configurations：
    LIS-AN50A Artificial Mains Network: Test voltage DC 1000V/AC 270V, test current 50A (LIS-AN100A and LIS-AN200A optional), N-type connector, impedance 50μH + 5Ω || 50Ω
    LIS-BCP310 Bulk Current Injection probe: frequency range 4 kHz~300 MHz; max attenuation 10 dB; N-type connector
    LIS-CCF600 Bulk Current Injection probe fixture: frequency range DC~500 MHz, VSWR 2:1
    Optional configurations：
    LIS-BCM410S High-current monitoring probe: frequency range 10 kHz~200 MHz, N-type output terminal..

    Note: The LISUN model LIS-CS115-CS116 is a device that incorporates both CS115 and CS116 testing functions.

    CS116 Measured Waveform Plot

    CS116 Measured Waveform Plot

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