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Complete Guide to IC Component Testing Using an Advanced IC Component CDM ESD Testing Equipment
29 Sep, 2026 98

Complete Guide to IC Component Testing Using an Advanced IC Component CDM ESD Testing Equipment

Abstract During the production, transportation and assembly of semiconductor chips, charged‑device‑model electrostatic discharge constitutes a major cause of unexpected failures of integrated circuits. Such failures feature strong concealment, ultra‑short pulse duration and high difficulty in failure reproduction. Conventional Human‑Body Model (HBM) and Machine Model (MM) tests cannot full...

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